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扫描探针显微镜系列及其应用综述

田文超;贾建援

  

  1. (西安电子科技大学 机电工程学院, 陕西 西安 710071)

  • 收稿日期:1900-01-01 修回日期:1900-01-01 出版日期:2003-02-20 发布日期:2003-02-20

Overview of the mechanisms and applications of the scanning probe microscope series

TIAN Wen-chao;JIA Jian-yuan

  

  1. (School of Mechano-electronic Engineering, Xidian Univ., Xi'an 710071, China)
  • Received:1900-01-01 Revised:1900-01-01 Online:2003-02-20 Published:2003-02-20

摘要: 扫描探针显微镜将人类带入原子世界,使人类不仅能够观察到物质表面原子的排布情况,而且能够按照人类的意图实现原子操纵.回顾了扫描探针显微镜的历史,介绍了目前国际上各种系列的扫描探针显微镜基本原理、主要特点、研究现状和最新应用情况,重点介绍了原子操纵和生命科学、信息科学领域的应用,提出了扫描探针显微镜目前的研究方向.

关键词: 扫描探针显微镜, 扫描隧道显微镜, 原子力显微镜, 原子操纵, 纳米技术

Abstract: The Scanning Probe Microscope(SPM), which was invented for imaging the topographic at the atomic level, becomes a method for manipulating the single atom and fabricating nanometer-scale structures on the solid surface and for the realization of single-atom and single-electron devices. This capability makes it increasingly attractive and powerful for use in diverse areas, such as gene engineering, life science, material science, biotechnology and surface technology. The histories of the Scanning Probe icroscopy are introduced in this paper, followed by the principles, characteristics, actual conditions and applications. Its applications in single atom mainpulation, life science and information science are emphasized. Finally the research directions are put forward.

Key words: scanning probe microscope, scanning tunneling microscope, atomic force microscope, single atom mainpulation, nanometer-technology

中图分类号: 

  • TH742
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