考虑工艺波动的两相邻耦合RC互连串扰噪声估计

doi:10.3969/j.issn.1001-2400.2010.06.018

J4 ›› 2010, Vol. 37 ›› Issue (6): 1082-1087+1131.doi: 10.3969/j.issn.1001-2400.2010.06.018

考虑工艺波动的两相邻耦合RC互连串扰噪声估计

董刚;杨杨;柴常春;杨银堂

(西安电子科技大学宽禁带半导体材料与器件教育部重点实验室，陕西西安 710071)

收稿日期:2010-04-22 出版日期:2010-12-20 发布日期:2011-01-22
通讯作者: 董刚
作者简介:董刚(1978-)，男，副教授，博士，E-mail: gdong@mail.xidian.edu.cn．
基金资助:
国家自然科学基金资助项目(60606006);国家杰出青年基金资助项目(60725415);西安电子科技大学基本科研业务费资助项目

Crosstalk noise estimation of two adjacent RC interconnects with process variations

DONG Gang;YANG Yang;CHAI Chang-chun;YANG Yin-tang

(Ministry of Education Key Lab. of Wide Band-Gap Semiconductor Materials and Devices, Xidian Univ., Xi'an 710071， China)

Received:2010-04-22 Online:2010-12-20 Published:2011-01-22
Contact: DONG Gang

摘要/Abstract

摘要：

基于6节点耦合互连串扰噪声电路模型，提出了一种新的考虑工艺波动的统计互连串扰噪声分析方法，在给定互连参数波动范围条件下，推导出了耦合互连统计串扰噪声的均值和标准差的解析表达式．实验结果表明，与在互连工艺波动研究中广泛采用的蒙特卡罗方法相比，新方法在确保计算精度的前提下大大缩短了计算时间，且采用新方法计算得到的RC互连串扰噪声均值误差低于2.36％，而标准差误差则低于7.23％．

关键词: 工艺波动, RC互连, 串扰噪声, 统计模型

Abstract:

Based on the six-node template circuit of coupling interconnects, a novel method for analyzing the statistical crosstalk noise of RC interconnects with process variations is proposed. Analytical expressions for mean and standard deviation of the statistical crosstalk noise are derived for a given fluctuation range of interconnect parameters. Simulation results show that the time of calculation is greatly shortened with a good calculating precision using the proposed statistical model as compared to the widely used Monte Carlo method. Calculated results also indicate that the errors of the mean and standard deviation are less than 2.36％ and 7.23％ respectively.

Key words: process variations, RC interconnect, crosstalk noise, statistical model

董刚;杨杨;柴常春;杨银堂. 考虑工艺波动的两相邻耦合RC互连串扰噪声估计[J]. J4, 2010, 37(6): 1082-1087+1131.

DONG Gang;YANG Yang;CHAI Chang-chun;YANG Yin-tang. Crosstalk noise estimation of two adjacent RC interconnects with process variations[J]. J4, 2010, 37(6): 1082-1087+1131.

参考文献

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考虑工艺波动的两相邻耦合RC互连串扰噪声估计

Crosstalk noise estimation of two adjacent RC interconnects with process variations

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