J4 ›› 2014, Vol. 41 ›› Issue (5): 180-184+206.doi: 10.3969/j.issn.1001-2400.2014.05.030

• 研究论文 • 上一篇    下一篇

可修复的k/n表决系统的可靠性分析

方永锋1,2;陈建军2;曹鸿钧2
  

  1. (1. 毕节学院 机械工程学院,贵州 毕节  551700;
    2. 西安电子科技大学 电子装备结构设计教育部重点实验室,陕西 西安  710071)
  • 收稿日期:2013-05-16 出版日期:2014-10-20 发布日期:2014-11-27
  • 通讯作者: 方永锋
  • 作者简介:方永锋(1975-) ,男,副教授,博士, E-mail: fangyf_9707@126.com.
  • 基金资助:

    国家自然科学基金资助项目(50905134);中央高校基本科研基金资助项目(JY10000904012)

Analysis of dynamic reliability of the repairable k-out-of-n system under several times random shocks

FANG Yongfeng1,2;CHEN Jianjun2;CAO Hongjun2   

  1. (1. School of Mechanical Engineering, Bijie University, Bijie  551700, China;
    2. Ministry of Education Key Lab. of Electronic Equipment Structure, Xidian Univ., Xi'an  710071, China)
  • Received:2013-05-16 Online:2014-10-20 Published:2014-11-27
  • Contact: FANG Yongfeng

摘要:

根据强度-应力干涉理论,给出了k/n表决系统的单元在多次随机作用下且单元抗力退化情况下的动态可靠性指标计算模型,由可靠性指标求得单元的动态失效概率.根据单元的动态失效概率,给出了在多次随机外部作用下,单元失效数目变化的概率,再由可修复k/n系统所具有的马尔可夫性质,给出了在多次随机外部作用下的可修复k/n系统的转移概率,由转移概率获得概率密度矩阵,通过求解微分方程组计算出系统的动态可靠度.最后通过算例说明该方法方便易行,计算结果符合工程实际.

关键词: 随机作用, 可修复, k/n系统, 动态, 可靠性

Abstract:

The model of unit dynamic reliability of the reparable k-out-of-n system is given under several times random shocks with the strength of unit degradation according to the strength-stress theory and the unit failure probability can be observed by using the dynamic reliability. The unit failure number can be obtained under several times random shocks according to the unit failure probability. The conversion probability of the reparable k-out-of-n system is given by its Markov property under several random shocks. The probability density matrix is observed by the conversion probability, and then the dynamic reliability of the reparable k-out-of-n system is obtained by solving the differential equation systems. Finally, it is illustrated that the method is prachcable and convenient. The calculated result conforms to the engineering practice.

Key words: random shock, reparable, k-out-of-n system, dynamic, reliability

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