低成本片上射频内建自测系统的关键参数测量

doi:10.3969/j.issn.1001-2400.2017.04.006

Abstract

Abstract:

The major occupation in testing cost for the RF blocks of a system-on-chip (SOC) makes it a critical issue in the current complex integrated system. In this paper, a low cost RF Build-In Self-Test structure and methods for processing test data are proposed. The RF front-end has been tested with the help of on-chip DSP, CORDIC and ADC converters. The Digital Fourier Transform (DFT) and SNR results of the generated digital signature are presented in detail with the innovated logarithm calculation method. With the specified loopback structure design, the internal test tone can be used to avoid external noise influence. The RF BIST is applied and verified in mass production, which is effective for low-cost production. Compared to the traditional RF testing, this method can reduce the hardware overhead and decrease the cost with high testing quality.

Key words: radio frequency build-in self-test, coordinate rotation digital computer, loopback structure, signal-to-noise ratio

ZHU Jia;LIU Hongxia. RF build-in self-test and key measurement processing for the low-cost system-on-chip[J].Journal of Xidian University, 2017, 44(4): 29-33.

References

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RF build-in self-test and key measurement processing for the low-cost system-on-chip

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